During the semiconductor fabrication process, defects may occur in some of the pixels of the image sensor. Defective pixels used in an imaging device may result in visible defects in a processed image such as a bright or a dark spot in the processed image. The pixel with the defect is referred to as a defect pixel or bad pixel.
Our defect correction core automatically corrects defects by edge adaptive method during the operation of image sensor. Our defect correction core don't need the test equipment and defect detection software.
Some defect correction cores correct defects by horizontal buffer only so that it reduces the image resolution and can't correct defects at edge pixel. But our defect correction core corrects defect by edge adaptive method using 4 line memories and sophisticated algorithm so that the image resolution is not reduced almost and can correct defects at edge pixel. But some defect correction cores reduce the image resolution and can't correct defects at edge pixel in spite of using the line memories.
| Features |
|---|
| Automatic defect correction mode |
| Manual defect correction mode |
| Support automatic defect correction mode and manual defect correction mode at the same time. |
| Edge adaptive method by using 4 line memories |
